Other articles related with "back-gate voltage":
118106 Yan-Kun Yang(杨燕琨), Tie-Feng Yang(杨铁锋), Hong-Lai Li(李洪来), Zhao-Yang Qi(祁朝阳), Xin-Liang Chen(陈新亮), Wen-Qiang Wu(吴文强), Xue-Lu Hu(胡学鹿), Peng-Bin He(贺鹏斌), Ying Jiang(蒋英), Wei Hu(胡伟), Qing-Lin Zhang(张清林), Xiu-Juan Zhuang(庄秀娟), Xiao-Li Zhu(朱小莉), An-Lian Pan(潘安练)
  High performance photodetectors based on high quality InP nanowires
    Chin. Phys. B   2016 Vol.25 (11): 118106-118106 [Abstract] (834) [HTML 1 KB] [PDF 1003 KB] (401)
37305 Zhuang Xiang(庄翔), Qiao Ming(乔明), Zhang Bo(张波), and Li Zhao-Ji(李肇基)
  Analysis of the breakdown mechanism for an ultra high voltage high-side thin layer silicon-on-insulator p-channel lateral double-diffused metal oxide semiconductor
    Chin. Phys. B   2012 Vol.21 (3): 37305-037305 [Abstract] (1113) [HTML 1 KB] [PDF 1679 KB] (24121)
First page | Previous Page | Next Page | Last PagePage 1 of 1